 |
|
Review of Electrical Characterization of Ceramic Thin Films for the Next Generation Semiconductor Devices
Donghyun Lee, Kun Yang, Ju-Yong Park, Min Hyuk Park
Ceramist. 2019;22(4):332-349. Published online 2019 Dec 31 DOI: https://doi.org/10.31613/ceramist.2019.22.4.03
|
|
Citations to this article as recorded by
 Discrete element modelling of the size-dependent mechanical behavior of Al2O3 ceramic under quasi-static uniaxial compression
Du-min Kuang, Jia Su, Ikechukwu Ogwu, Feng-lan Kuang, Biao Luo
Ceramics International.2024; 50(5): 7878. CrossRef Fully solution-processed organic RRAM device with highly stable butterfly-shaped hysteresis
Mehr Khalid Rahmani, Sobia Ali Khan, Muhammad Farooq Khan, Moon Hee Kang
Materials Science and Engineering: B.2022; 282: 115784. CrossRef
|